Development of in-situ techniques for characterization of materials and nanostructures

The aim of the proposed project is to develop new technologies for the LiteScope device ™ expanding its imaging capabilities with functionalities that will attract new users-customers and help Nenovision to establish itself in developed foreign markets. Three areas have been identified that will allow the necessary technological and commercial advantage to be obtained. The project covered development of: a) unique multifunctional probes for scanning probe microscopy with the possibility of applying electrical voltage, intense laser light and a working gas through a probe cavity to the sample surface, b) highly compact device for in-situ mechanical loading, c) own very precision probes and automated etching equipment for their electrochemical preparation and their characterization.