| | 1st International Workshop on Frontiers of X&XUV optics and its applications - Scientific Program |
| 26.10.2015 | |
| 12:00-13:00 | Registration |
| 13:00-13:15 | Invitation |
| | Optical elements for X&XUV region |
| | Author | Title |
| 13:15-13:45 | Sobota J et al. | Multilayer EUV optics in Institute of Scientific Instruments of the ASCR |
| 13:45-14:15 | Pína L | Reflective EUV/X-ray optics |
| 14:15-14:45 | Schmidt J et al. | XUV laser beam focused by a spherical mirror with/without multi-layer coating |
| 14:45-15:15 | Mann K et al. | Optics for laser-driven EUV/SXR sources and wavefront measurements at short wavelengths |
| 15:15-15:45 | Coffee break |
| | Sources of XUV/SXR radiation |
| | Author | Title |
| 15:45-16:15 | Parkman T et al. | Optimization possibilities of nitrogen capillary discharge as a source of monochromatic radiation in water window region at λ=2.88nm |
| 16:15-16:45 | Straus J. et al. | Nitrogen XUV laser - design of feasibility tests with the help of thin filters |
| 16:45-17:15 | Kozlová M et al | Laser driven secondary sources at PALS facility and their applications |
| 17:15-17:45 | Nejdl J et al. | Prospects for bright laser-driven short-wavelength sources and their applications at ELI Beamlines |
| 17:45-18:45 | Dinner-time |
| 27.10.2015 | |
| | Application of optical elements to imaging and focusing |
| | Author | Title |
| 08:30-09:00 | Muhammad Fahad Nawaz | XUV focusing and imaging optics schemes in capillary discharge based soft X-ray microscope |
| 09:00-09:30 | Bartnik A et al. | Application of SXR and EUV optics for photoionization experiments |
| 09:30-10:00 | Pína L. | Grazing incidence EUV/X-ray mirrors applications |
| 10:00-10:30 | Juschkin L. | Application of lens-less imaging techniques for nano-scale microscopy employing plasma-based EUV source |
| 10:30-11:00 | Coffee break |
| | Application of optical elements to spectroscopy and interferometry |
| | Author | Title |
| 11:00-11:30 | Koláček K et al. | A new method of wavelength calibration of (McPherson´s) XUV grazing incidence spectrograph |
| 11:30-12:00 | Frolov O. et al. | A new EUV interferometer for generation of dense interference patterns - first experimental results |
| 12:00-12:30 | Juschkin L. | Source radiance requirements for high-resolution imaging and interference techniques |
| 12:30-13:00 | Artyukov I A et al | Design of X-ray beamline for a Thomson source |
| 13:00-13:05 | Conclusion |
| 13:05-14:00 | Lunch-time |
| Program change reserved |