The Laboratories are specialize to development of new instrumentation and methods for scanning electron microscopes. We make imaging of samples of various properties and specific requirements on their observation (metals and alloys, composite materials and polymers, electronics materials, ceramic materials, natural and biological materials).We have experimental and theoretical activities related to imaging of specimens with electrons of energy below 1000 eV, fit for high resolution imaging without metal coating. We do imaging in reflected and transmitted detection mode.

Scanning electron microscopes:

• FEI MAGELLAN 400
• JEOL JSM 6700F
• TESCAN VEGA 5130

Analysers:

• Energy dispersive analyzer of X-rays (INCA 350 and EDAX Apolo X)
• Electron Back Scattered Diff raction Analyzer (Hikari)
• Cathodoluminescence detector (Gatan MonoCL)

We cooperate with companies which developed scanning electron microscopes, other institutes of AS CR, university and comercial scope.